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Beilstein J. Nanotechnol. 2018, 9, 1647–1658, doi:10.3762/bjnano.9.157
Figure 1: Friction force maps for a) an oxidized Si(100) surface scanned with an intact Ar-sputter cleaned SiO...
Figure 2: Graphs exemplifying the absence of contact ageing for slide–hold–slide experiments under UHV condit...
Figure 3: Development of friction for different tip–surface pairs upon activation of the interface. 1 – Contr...
Figure 4: Lateral force loops of the same line from different scan frames. The respective scan number is indi...
Figure 5: Surface topography of the same area before (upper row) and after (lower row) the friction sequences...
Figure 6: Scanning electron microscopy (SEM) images (secondary electrons (SE), back-scattered electrons (BSE)...
Figure 7: TEM images of a cross section through the apex of a Au/Si tip that had been sliding against Au(111)...